Technical Session -- Flash Memory
Session Chair
Dr. Doug Sheldon, Jet Propulsion Laboratories
Dr. Doug Sheldon, Jet Propulsion Laboratories
Click on a talk title to view its abstract if available
Pitch Fragmentation Induced Odd/Even Effects In A 36 Nm Floating Gate NAND Technology
Florian Beug
Qimonda Dresden GmbH
Florian Beug
Qimonda Dresden GmbH
A novel Flash EEPROM Diagnosis Methodology based on I-V Signatures extraction
Jeremy Plantier
IM2NP Laboratory
Jeremy Plantier
IM2NP Laboratory
A full TCAD simulation and 3D parasitic capacitances extraction in 90nm NAND Flash memories
Jérémy Postel-Pellerin
IM2NP Laboratory
Jérémy Postel-Pellerin
IM2NP Laboratory

